一、前言
 
锡须，一种自发从锡和锡合金层生长出来的现象，它会导致电路短路,影响电子产品长期的可靠性。过去五十年间，对锡须机理及其抑制进行了大量的工作。本讲座将对于此有关的大量文献作一概述并且介绍锡须研究的最新成果，包括锡须机理及其抑制。

Tin whiskers, growing spontaneously from Sn and Sn alloy coatings, can cause electrical shorts in the circuit and present a long-term reliability problem to the electronic industry. Extensive work has been performed in the last fifty years to understand the mechanism of tin whisker formation and to develop methods for prevention and minimization. This workshop will provide an overview of the vast literature and the latest development in tin whisker research, from the understanding of the mechanism to the remedies for whisker minimization.
 
二、课程内容介绍
 
 

※ 什么是锡须？
※ 锡须是怎么形成和生长的？
※ 锡须形成的机理
※ 锡须形成的热力学驱动力
※ 锡须形成的影响因素（形核核生长）
※ 测试锡须的方法（NEMI, JEITA 和E3）
※ 锡须的防止
 

※ What is tin whisker?
※ How does the tin whisker form and grow?
※ Mechanisms of whisker formation.
※ Thermodynamic driving force for whisker formation.
※ Factors affecting whisker formation (nucleation and growth).
※ Methods for testing whisker (NEMI, JEITA and E3).
※ Remedies for whisker prevention.

 
 
三、授课对象：
 
本课程适合实施无铅制造的电子工程师，科学家，管理人员和设计者。
 
四、主讲师简介：  陈旭博士
 
 

陈旭博士,朗讯科技公司可靠性研究部可靠性工程师。在半导体,电子封装，电子制造，表面镀层及涂覆，失效模式分析和可靠性评估方面具有丰富经验。陈博士 曾获得多个奖项，包括在SUR/FIN2000的“Excellence in Presentation Awards”和在APEX会议的“Best Paper Award”。陈旭1983年上海同济大学获得化学学士学位,1991年德国波鸿的鲁尔大学获得博士学位,担任过Enthone, Cookson Electronics公司的高级科学家，朗讯科技公司的项目领导人/MTS ，在Hoechst 研究和技术中心担负研发工作。

Dr. Chen Xu is a reliability engineer with Lucent Technologies Reliability Research Department. He has extensive experience in the fields of semiconductor and electronic packaging, electronic manufacturing, surface finishes and coatings, failure mode analysis and reliability assessment. Dr. Xu has received several awards including the Excellence in Presentation Awards at SUR/FIN 2000 and Best Paper Award at APEX conference in 2002 and 2004. He is the author and coauthor of more than 90 publications and over 30 presentations.  Chen Xu received his BS Degree in Chemistry from Tongji University in Shanghai, China in 1983 and his Ph.D. in Physical Chemistry from Ruhr-University Bochum, Germany in 1991. Dr. Xu’s career also includes Senior Scientist with Enthone, Cookson Electroncis, project leader/MTS with Lucent Technologies and R&D positions at Hoechst Research and Technology Center.
 
 

五、结业证书：学员结业后由中国电子专用设备工业协会颁发结业证书